1

SCALING OF SOCIOMETRIC DEVICES

Oliver F. Anderhalter
Journal:
Yearbook of the National Council on Measurements Used in Education
Year:
1955
Language:
english
File:
PDF, 499 KB
english, 1955
2

Quantitative EDAX analysis of sediments

Robert Anderhalt
Journal:
Micron and Microscopica Acta
Year:
1984
Language:
english
File:
PDF, 134 KB
english, 1984
4

Windowless Silicon Drift Detectors

Anderhalt, R, Sandborg, A
Journal:
Microscopy and Microanalysis
Year:
2011
Language:
english
File:
PDF, 429 KB
english, 2011
5

Developing Uniform Departmental Grading Standards in a University

Anderhalter, O. F.
Journal:
The Journal of Experimental Education
Year:
1962
Language:
english
File:
PDF, 319 KB
english, 1962
8

Calculating an EDS Spectrum without Scatter in LV Mode

Anderhalt, R, Swenson, L M
Journal:
Microscopy and Microanalysis
Year:
2005
Language:
english
File:
PDF, 229 KB
english, 2005
9

Fast X-ray Mapping with Excellent Light Element Performance from an SDD

Redfern, D, Anderhalt, B, Sandborg, A
Journal:
Microscopy and Microanalysis
Year:
2007
Language:
english
File:
PDF, 574 KB
english, 2007
10

Attaining High Count Rates and X-Ray Mapping for the SDD

Anderhalt, R, Redfern, D, Sandborg, A
Journal:
Microscopy and Microanalysis
Year:
2007
Language:
english
File:
PDF, 519 KB
english, 2007
11

X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors

Anderhalt, R, Redfern, D, Sandborg, A
Journal:
Microscopy and Microanalysis
Year:
2008
Language:
english
File:
PDF, 3.56 MB
english, 2008
12

Imaging with Milli-XRF Benchtop Instrumentation

Scruggs, BE, Anderhalt, RW, Herczeg, LI, Lee, A
Journal:
Microscopy and Microanalysis
Year:
2010
Language:
english
File:
PDF, 473 KB
english, 2010
13

Improved EDS Performance at EBSD Geometry

Nowell, M, Anderhalt, R, Nylese, T, Eggert, F, de Kloe, R, Schleifer, M, Wright, S
Journal:
Microscopy and Microanalysis
Year:
2011
Language:
english
File:
PDF, 435 KB
english, 2011
14

Determining Chemical Phases from Elemental Maps of Tablets

Anderhalt, R, Nylese, T
Journal:
Microscopy and Microanalysis
Year:
2010
Language:
english
File:
PDF, 923 KB
english, 2010
16

Identification and Local Chemical Analysis of Pharmaceutical Impurities

Nylese, T, Anderhalt, R, Patel, U
Journal:
Microscopy and Microanalysis
Year:
2011
Language:
english
File:
PDF, 2.43 MB
english, 2011
17

X-Ray Images with Silicon Drift Detectors

Anderhalt, R, Nylese, T
Journal:
Microscopy and Microanalysis
Year:
2011
Language:
english
File:
PDF, 1.87 MB
english, 2011
18

The How and Why of Smart Features

Anderhalt, R, Nylese, T
Journal:
Microscopy and Microanalysis
Year:
2011
Language:
english
File:
PDF, 1.11 MB
english, 2011
21

Advanced Materials Characterization with Full-Spectrum Phase Mapping

Nylese, Tara, Anderhalt, Robert
Journal:
Microscopy Today
Year:
2014
Language:
english
File:
PDF, 7.32 MB
english, 2014
22

A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness

Anderhalt, R, Chan, D, Lupu, M
Journal:
Microscopy and Microanalysis
Year:
2009
Language:
english
File:
PDF, 1.72 MB
english, 2009
25

Applications for Automated Particle Analysis

Anderhalt, Robert, Swenson, Lara
Journal:
Microscopy Today
Year:
2006
Language:
english
File:
PDF, 1.42 MB
english, 2006